메뉴 건너뛰기
소속 기관 / 학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
고객센터 ENG
주제분류

논문 기본 정보

저자정보
(요꼬가와B/D) (숭실대학교) (숭실대학교) (숭실대학교) (숭실대학교)
저널정보
한국위험물학회 한국위험물학회지 한국위험물학회지 제12권 제3호
오류 신고하기

피인용 0

검색

    초록·키워드

    Average probability of dangerous failure on demand (PFD<sub>avg</sub> ) formula is derived in IEC 61508 edition 2.0 part 6 issued in 2010. But this formula is not consistent with the reality applied in safety instrumented function (SIF) design concept of process industry. Nowadays the safe detected failure, safe undetected failure and dangerous detected failure of sensor, logic solver and final element are designed to immediately lead to shutdown and system alarm in accordance with fail safe concept. But the PFD<sub>avg</sub> formula in IEC 61508 edition 2.0 is derived based on the condition that dangerous detected failure does not lead to shutdown for mean repair time (MRT) after failure. So the PFD <sub>avg</sub> formula shall need to be improved to suit the reality of plant. In this research, the PFD<sub>avg</sub> formula are derived by reliability block diagram (RBD) methodology considering that only dangerous undetected failure leads to accident. Common cause factor (β)and proof test coverage (PC) are included in PFD<sub>avg</sub> . The remaining two methodologies to determine result safety integrity level (SIL) like architectural constraint and systematic capability (SC) are excluded in this research. The votings discussed in this research are 1oo1, 1oo2, 2oo2, 2oo3 and 1oo3. The lower PFD<sub>avg </sub>will be derived by more realistic PFD<sub>avg</sub> formula than the formula in IEC 61508 edition 2.0 if new PFD<sub>avg</sub> is applied to real plant design. This new formula make the safer design and operation possible with the lower instrument investment cost.

    최근 본 자료 전체보기

      UCI(KEPA) : I410-151-25-02-092137382