인문학
사회과학
자연과학
공학
의약학
농수해양학
예술체육학
복합학
DBpia AI
AI 에이전트
AI 아이디어
AI 리더
AI 뷰어
Citeasy
크롬 서지관리 다운로드
지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
초록·키워드
This paper presents a novel image-level anomaly detection control method for defect inspection, which comprises feature- extraction from high-dimensional data and feature-learning to analyze the observed patterns. we focus on the feature-learning step, especially in Deep SVDD. To determine anomalies from images of object suspected to be defective, Deep SVDD learns the decision boundaries for the normal feature distribution in the latent space. When a new image is received by the defect inspection system, Deep SVDD maps its features to the latent space and detects anomalies based on whether the observed features fall within the decision boundaries for normal features. The decision boundary of Deep SVDD is determined based on the center-point, which is the center position of the decision boundary. The center-point is randomly fixed at the beginning of training of Deep SVDD. However, this limits the possibility of finding the optimal decision boundary. Therefore, we propose a center-point-moving method to optimize the center-point location and improve the performance of Deep SVDD. To confirm the suitability of the proposed method, we conducted experiments on MVTec-AD, a defect inspection dataset for several products in the manufacturing industry. Based on the results, the proposed method improved the performance of Deep SVDD in 11 of the 15 class domains in the MVTec-AD dataset.
본문·목차
인공지능 문자 인식 모델을 통해 추출된 텍스트로, 일부 오타나 오류가 포함될 수 있으나 지속적으로 개선 중입니다.
오류를 발견하셨다면 해당 부분을 드래그한 후 ' 를 통해 신고해주세요.
오류를 발견하셨다면 해당 부분을 드래그한 후 ' 를 통해 신고해주세요.
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UCI(KEPA) : I410-151-25-02-092746729
