메뉴 건너뛰기
소속 기관 / 학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
고객센터 ENG
주제분류

논문 기본 정보

저자정보
(Hankuk University of Foreign Studies) (Hankuk University of Foreign Studies)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.26 No.4
오류 신고하기

피인용 1

검색

    초록·키워드

    An improved SPICE macro model based on BSIMSOI4 has been proposed for accurate modeling of short-channel floating-body PD-SOI MOSFETs. The kink and self-heating effects are modeled individually using empirical I-V equations. For both low-frequency and RF inductive effects, frequency-dependent empirical equations of intrinsic output capacitance and conductance are newly used to accurately model the overlapping behavior of both effects in the low-frequency region. This model shows improved Y22-parameter fitting accuracy compared to conventional models. To account for substrate loss not considered in BSIMSOI4, the substrate resistance is externally added to the model, improving S-parameter accuracy at high frequencies. The proposed RF-based extraction method allows precise modeling of overlap and junction capacitance parameters. Validation against measured S-parameters at 0.1 μm gate length up to 20 GHz confirms the accuracy of the improved model and parameter extraction across various bias conditions.

    최근 본 자료 전체보기