메뉴 건너뛰기
소속 기관 / 학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
고객센터 ENG
주제분류

논문 기본 정보

저자정보
(Henan University of Science and Technology) (Henan University of Science and Technology) (Henan University of Science and Technology) (Henan University of Science and Technology) (Henan University of Science and Technology)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.26 No.5
오류 신고하기

피인용 0

검색

    초록·키워드

    A method for extracting intrinsic parameters by combining the Principal Component Analysis (PCA) algorithm with the Osprey Optimization Algorithm (OOA) is proposed in this paper. Traditional methods for extracting intrinsic parameters from Gallium Nitride High Electron Mobility Transistors (GaN HEMTs) face challenges, such as long S-parameter modeling times and low accuracy. To improve model accuracy, the OOA algorithm can be used to optimize the intrinsic parameters. However, the OOA algorithm has drawbacks, such as a tendency to fall into local optima and high sensitivity to parameters. Additionally, it does not account for correlations between intrinsic parameters, which limits improvements in model accuracy. To further enhance the model’s precision, PCA is applied in this paper to strengthen the correlation between intrinsic parameters. The PCA-processed intrinsic parameters are then combined with the OOA algorithm for extraction. Experimental results show that over the wide frequency range of 0.5–20.5 GHz, the PCA-OOA algorithm significantly improves S-parameter modeling accuracy compared to traditional extraction techniques, offering a new approach for efficient and accurate modeling of GaN HEMT devices.

    최근 본 자료 전체보기