저자의 연구 키워드

저자의 연구 키워드

#2D technology computer-aided design (TCAD)

#3D architecture

#3-D device simulation

#3-D TCAD

#AlGaN

#AlGaN/GaN

#AlGaN/GaN HEMT

#Artificial Intelligence Model

#Band-to-band tunneling (BTBT)

#Beta-gallium oxide

#Betavoltaic cell

#boost converter

#breakdown voltage

#Capacitorless DRAM

#Data Preprocessing

#Device Degradation

#Displacement damage

#dual gate dielectric

#Dual Metal Gate (DMG)

#dual-metal gate

#Equipment Conditions

#field-effect transistor (FET)

#fin-shaped field-effect transistor (FinFET)

#fin-type field-effect transistor (FinFET)

#Gallium nitride

#Gallium nitride (GaN)

#GaN

#GaN MIS-HEMT

#gate-all-around junctionless field effect transistor (GAA-JLFET)

#HEMT

#high electron mobility transistor (HEMTs)

#High-efficiency

#InGaAs

#Ion Implanter

#Junctionless

#metal-insulator-semiconductor (MIS)

#Multi-well structure

#Nanowire junctionless field-effect transistor

#normally-off

#One transistor DRAM

#One transistor dynamic random-access memory (1T-DRAM)

#one-transistor dynamic random-access memory

#PNPN

#power device

#power transistor

#Proton irradiation

#proton irradiation effects

#Radiation Reliability

#recessed gate

#recessed gate technique

#reliability analysis

#Retention time

#retention time (RT)

#Sensing margin

#sensing margin (SM)

#short-channel effect (SCE)

#Si_0.8Ge_0.2

#silicon nitride (Si₃N₄)

#Simulation modeling

#TCAD simulation

#titanium dioxide (TiO₂)

#TMAH Surface Treatment

#tunneling field-effect transistors (TFETs)

#vertical device

#Vertical schottky barrier diode

#vertical transistor

#work-function variation

#Zero-temperature coefficient point