지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술대회자료
- 저자정보
- 발행연도
- 2012.11
- 수록면
- 333 - 336 (4page)
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초록· 키워드
오류제보하기
Scan test which is one of the useful design for testability techniques is effective for LSIs including cryptographic circuit. It can observe and control the internal states of the circuit under test by using scan chain. However, scan chain presents a significant security risk of information leakage for scan-based attacks which retrieves secret keys of cryptographic LSIs. In this paper, a secure scan architecture against scan-based attack which still has high testability is proposed. In our method, scan data is dynamically changed by adding the latch to any FFs in the scan chain. We show that by using proposed method, neither the secret key nor the testability of an RSA circuit implementation is compromised, and the effectiveness of the proposed method.
목차
Abstract
Ⅰ. INTRODUCTION
Ⅱ. PRELIMINARIES
Ⅲ. SECURE SCAN ARCHITECURE
Ⅳ. IMPLEMENTATION AND SECURITY ANALYSIS
Ⅴ. CONCLUSION
REFERENCES
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UCI(KEPA) : I410-ECN-0101-2014-569-000729849