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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.13 No.1
- 발행연도
- 2013.2
- 수록면
- 43 - 47 (5page)
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초록· 키워드
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In this work, we report extraction of the density-of-states (DOS) in polymer-based organic thin film transistors through the multi-frequency C-V spectroscopy. Extracted DOS is implemented into a TCAD simulator and obtained a consistent output curves with non-linear characteristics considering the contact resistance effect. We employed a Schottky contact model for the source and drain to fully reproduce a strong nonlinearity with proper physical mechanisms in the output characteristics even under a very small drain biases. For experimental verification of the model and extracted DOS, 2 different OTFTs (P3HT and PQT-12) are employed. By controlling the Schottky contact model parameters in the TCAD simulator, we accurately reproduced the nonlinearity in the output characteristics of OTFT.
목차
Abstract
I. INTRODUCTION
II. STRUCTURE AND FABRICATION OF OTFTS
III. EXPERIMENTAL RESULTS AND DISCUSSION
IV. SUMMARY
REFERENCES
참고문헌 (4)
참고문헌 신청
1. [학술지(정기간행물)] - J. Jang / 2012 / Extraction of the sub-bandgap density-of-states in polymer thin-film transistors with the multi-frequency capacitance-voltage spectroscopy / APPLIED PHYSICS LETTERS 100 (13) : 133506-1 ~ 133506-5
2. [학술지(정기간행물)] - G. B. Blanchet / 2004 / Contact resistance in organic thin film transistors / Appl. Phys. Lett 84 (2) : 296 ~ 298
3. [학술지(정기간행물)] - C. R. Crowell / 1966 / CURRENT TRANSPORT IN METAL-SEMICONDUCTOR BARRIERS / Solid-State Electronics 9 : 1035 ~ 1048
4. [기타자료] - / / ATLAS Device simulation software User’s Manual / SILVACO International
2. [학술지(정기간행물)] - G. B. Blanchet / 2004 / Contact resistance in organic thin film transistors / Appl. Phys. Lett 84 (2) : 296 ~ 298
3. [학술지(정기간행물)] - C. R. Crowell / 1966 / CURRENT TRANSPORT IN METAL-SEMICONDUCTOR BARRIERS / Solid-State Electronics 9 : 1035 ~ 1048
4. [기타자료] - / / ATLAS Device simulation software User’s Manual / SILVACO International
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UCI(KEPA) : I410-ECN-0101-2014-569-000245271