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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.14 No.1
- 발행연도
- 2014.2
- 수록면
- 124 - 130 (7page)
이용수
초록· 키워드
오류제보하기
In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.
목차
Abstract
Ⅰ. INTRODUCTION
Ⅱ. RELATED WORKS
Ⅲ. PROPOSED SCAN-BASED ON-LINE AGING MONITORING SCHEME
Ⅵ. EXPERIMENTAL RESULTS
Ⅴ. CONCLUSIONS
REFERENCES
참고문헌 (17)
참고문헌 신청
1. [기타자료] - / 2009 / International Technology Roadmap for Semiconductors
2. [학술지(정기간행물)] - W. Wang / 2007 / Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS technology / IEEE Trans. On Device and Material Reliability 7 (4) : 509 ~ 517
3. [학술대회논문] - T. W. Chen / 2008 / Gate-Oxide Early Failure Prediction / Proc. IEEE VLSI Test Symp. : 111 ~ 118
4. [학술대회논문] - M. Noda / 2010 / On Estimation of NBTI-Induced Delay Degradation / IEEE European Test Symp. : 107 ~ 111
5. [학술대회논문] - Y. Li / 2008 / CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns / Proc. Design Automation and Test in Europe : 885 ~ 890
2. [학술지(정기간행물)] - W. Wang / 2007 / Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS technology / IEEE Trans. On Device and Material Reliability 7 (4) : 509 ~ 517
3. [학술대회논문] - T. W. Chen / 2008 / Gate-Oxide Early Failure Prediction / Proc. IEEE VLSI Test Symp. : 111 ~ 118
4. [학술대회논문] - M. Noda / 2010 / On Estimation of NBTI-Induced Delay Degradation / IEEE European Test Symp. : 107 ~ 111
5. [학술대회논문] - Y. Li / 2008 / CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns / Proc. Design Automation and Test in Europe : 885 ~ 890
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