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논문 기본 정보

자료유형
학술저널
저자정보
Libo Ai (University of Electronic Science and Technology of China) Shengxiang Bao (University of Electronic Science and Technology of China) Yongda Hu (University of Electronic Science and Technology of China) Xueke Wang (University of Electronic Science and Technology of China) Chuan Luo (University of Electronic Science and Technology of China)
저널정보
한국자기학회 Journal of Magnetics Journal of Magnetics Vol.22 No.1
발행연도
2017.3
수록면
49 - 54 (6page)

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초록· 키워드

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The significant reduction of the image quality caused by the magnetic field of samples is a major problem affecting the application of SEM (scanning electron microscopy) in the analysis of electronic devices. The main reason for this is that the electron trajectory is deflected by the Lorentz force. The usual solution to this problem is degaussing the sample at high temperatures. However, due to the poor heat resistance of some electronic components, it is imperative to find a method that can reduce the impact of magnetic field on the image quality and is straightforward and easy to operate without destroying the sample. In this paper, the influence of different magnetic field directions on the imaging quality was discussed by combining the experiment and software simulation. The principle of the method was studied, and the best observation direction was obtained.

목차

1. Introduction
2. Samples and Method
3. Results and Discussion
4. Conclusion
References

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UCI(KEPA) : I410-ECN-0101-2017-428-002313563