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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2019.3
- 수록면
- 15 - 20 (6page)
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Most high-efficiency n-type silicon solar cells are based on the high quality surface passivation and ohmic contact between the emitter and the metal. Currently, various metalization methods such as screen printing using metal paste and physical vapor deposition are being used in forming electrodes of n-type silicon solar cell. In this paper, we analyzed the degradation factors induced by the front electrode formation process using e-beam evaporation of double passivation structure of p-type emitter and Al2O3 / SiNx for high efficiency solar cell using n-type bulk silicon. In order to confirm the cause of the degradation, the passivation characteristics of each electrode region were determined through a quasi-steady-state photo-conductance (QSSPC) .
목차
ABSTRACT
1. 서론
2. 실험방법
3. 결과 및 분석
4. 결론
References
참고문헌 (5)
참고문헌 신청
2018 / ITRPV Ninth Edition 2018 Including Maturity Report
B. J. O’Sullivan / 2014 / Process-Induced Degradation of SiO2 and a-Si : H passivation Layers for Photovoltaic Applications / IEEE Journal of Photovoltaics 4(5):1197~1203
B. L. Sopori / 1994 / Hydrogen in silicon: current understanding of diffusion and passivation mechanisms / Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC) 2:1615~1620
A. W. Blakers / 1984 / Surface damage caused by electron-beam metallization of high open-circuit voltage solar cells / IEEE Electron Device Letters 5(7):246~247
J. Kopp / 1991 / Impact of metallization techniques on 20% efficient silicon solar cells / The Conference Record of the Twenty-Second IEEE Photovoltaic Specialists Conference - 1991 1:278~283
B. J. O’Sullivan / 2014 / Process-Induced Degradation of SiO2 and a-Si : H passivation Layers for Photovoltaic Applications / IEEE Journal of Photovoltaics 4(5):1197~1203
B. L. Sopori / 1994 / Hydrogen in silicon: current understanding of diffusion and passivation mechanisms / Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC) 2:1615~1620
A. W. Blakers / 1984 / Surface damage caused by electron-beam metallization of high open-circuit voltage solar cells / IEEE Electron Device Letters 5(7):246~247
J. Kopp / 1991 / Impact of metallization techniques on 20% efficient silicon solar cells / The Conference Record of the Twenty-Second IEEE Photovoltaic Specialists Conference - 1991 1:278~283
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UCI(KEPA) : I410-ECN-0101-2019-530-000577491