지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
초록· 키워드
오류제보하기
Contaminative artifacts such as carbonaceous materials
on carbon-coated microgrids are unavoidable, which is induced
by electron beam exposure inside electron microscopes. This
phenomenon raise a source to produce confusing information to
the samples investigated by analytical TEM, which should be alleviated
as much as possible. As experimental precautions for reducing
this unwanted effect, the use of LN2 cooled anti-contaminator
and pre-illumination of electron beam at low magnification can be
helpful. Nevertheless, we should be cautious to set an illumination
condition for microanalysis because the contaminative effect is
dependent with the types of irradiation situations, which is well
known to be a decisive factor for causing the carbonaceous artifacts.
Accordingly, it is necessary that optimal illumination to minimize
the contaminative effect should be selected for improving
the accuracy of microanalysis. In this paper, we introduce the practical
method to determine the optimal illumination condition by
evaluating the contaminative effect as a function of instrumental
spot size, which is directly linked with electron current density.
목차
등록된 정보가 없습니다.
참고문헌 (10)
참고문헌 신청
Cairney JM / 2003 / Redeposition effects in transmission electron microscope specimens of FeAl-WC composites prepared using a focused ion beam / Micron 34 : 97 ~ 107
Cheng A / 2006 / Does contamination buildup limit throughput for automated cryoEM? / J Struct Bio 154 : 303 ~ 311
Diociaiuti M / 2005 / Electron energy loss spectroscopy microanalysis and imaging in the transmission electron microscope: example of biological applications / J Electron Spe
Egerton RF / 2004 / Radiation damage in the TEM and SEM / Micron 35 : 399 ~ 409
Hren JJ / 1989 / Contamination and etching in : Principles of Analytical Electron Microscopy / Plenum New York : 353 ~ 392
Cheng A / 2006 / Does contamination buildup limit throughput for automated cryoEM? / J Struct Bio 154 : 303 ~ 311
Diociaiuti M / 2005 / Electron energy loss spectroscopy microanalysis and imaging in the transmission electron microscope: example of biological applications / J Electron Spe
Egerton RF / 2004 / Radiation damage in the TEM and SEM / Micron 35 : 399 ~ 409
Hren JJ / 1989 / Contamination and etching in : Principles of Analytical Electron Microscopy / Plenum New York : 353 ~ 392
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