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논문 기본 정보

자료유형
학술저널
저자정보
(Gwangju Institute of Science and Technology) (Gwangju Institute of Science and Technology)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.20 No.1
발행연도
수록면
105 - 118 (14page)
DOI
10.5573/JSTS.2020.20.1.105

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초록· 키워드

This study presents a 12-bit 40 MS/s successive approximation register (SAR) analog-to-digital converter (ADC) that utilizes a digital foreground self-calibration scheme for capacitor mismatches and a low-noise dynamic comparator. To reduce hardware complexity and AD power consumption, a split-capacitor, capacitive digital-to-analog converter (CDAC) is used to generate the comparator input voltage for binary search operations at the cost of increased capacitor matching requirements. Capacitor mismatches were calibrated with the digital foreground self-calibration technique, which was modified from our previous work to be adapted for the split-capacitor CDAC. In addition, a low-noise dynamic comparator that does not need an additional circuit and conversion cycles is also presented. A prototype ADC, which occupies an active die area of 0.098 ㎟, is fabricated with a 65 nm standard CMOS process. By using the mismatch calibration scheme, the ADC achieves a spurious-free dynamic range and a signal-to-noise and distortion ratios of 79.0 dB and 67.4 dB, respectively, for a sampling rate of 40-MSample/s. The power consumption of the ADC is 1.96 mW when driven with a 1.2 V supply and the figure-of-merit is 25.58 fJ/conversion-step.
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목차

  1. Abstract
  2. I. INTRODUCTION
  3. II. PROPOSED CAPACITOR MISMATCH CALIBRATION TECHNIQUE
  4. III. LOW NOISE DYNAMIC COMPARATOR
  5. IV. CIRCUIT DESIGN
  6. IV. PROTOTYPE DESIGN AND MEASUREMENT RESULTS
  7. V. CONCLUSION
  8. REFERENCES

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