메뉴 건너뛰기
소속 기관 / 학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
고객센터 ENG
주제분류

논문 기본 정보

저자정보
(Henan University of Science and Technology) (Henan University of Science and Technology) (Henan University of Science and Technology) (Henan University of Science and Technology) (Henan University of Science and Technology)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.22 No.6
오류 신고하기

피인용 0

검색

    초록·키워드

    Extreme Learning Machine (ELM) is a new learning algorithm for single-hidden layer feedforward neural network, which has been widely used in lots of fields. However, it still has the insufficiency of randomly determining the hidden layer threshold and output weight, which leads to ill-conditioned output. In order to avoid the risk of decreasing prediction accuracy caused by this possibility, the ELM is optimized using particle swarm algorithm. A Particle Swarm Optimization (PSO) enhanced ELM algorithm is proposed to accurately model the small-signal properties of InP Heterojunction Bipolar Transistors (HBTs). PSOELM algorithm solves the problem of unstable prediction data caused by random determination of input weights in ELM. Comparing the modeling effects of the PSO-ELM model and the ELM model under different bias conditions for a 1 μm×15 μm InP HBT, it is proved that the PSO-ELM algorithm has better consistency with the measured data.

    최근 본 자료 전체보기

      UCI(KEPA) : I410-ECN-0101-2023-569-000241209