메뉴 건너뛰기
소속 기관 / 학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
고객센터 ENG
주제분류

논문 기본 정보

저자정보
(Chungnam National University) (Chungnam National University)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.24 No.5
오류 신고하기

피인용 0

검색

    초록·키워드

    Nowadays, deep neural networks (DNNs) are being applied for safety-critical applications such as automotive and aerospace while emphasizing the high significance of lifetime resilience. Conversely, hardware accelerators have been employed for the efficient execution of complex DNNs on edge devices with resource constraints. Meanwhile, enhancing computation efficiency through redundancy elimination, coupled with technology feature size scaling, can elevate the vulnerability to aging, reducing the lifetime resilience of DNN accelerators. Previously, designers relied on conservative guard bands to prolong the lifetime of CMOS devices, albeit at the expense of performance loss. This paper proposes the serial processing approach for neural networks based on the redundant number system, which improves lifetime resilience without losing accuracy or performance but, with a few area and power overheads. We explore the number-system effect on BTI (Bias Temperature Instability) stress and consequent aging degradation. Experimental results of DNNs execution illustrate that the proposed computing approach mitigates stress by 36% on average leading to a 35.5% higher lifetime over the baseline.

    최근 본 자료 전체보기

      UCI(KEPA) : I410-151-25-02-090950690