인문학
사회과학
자연과학
공학
의약학
농수해양학
예술체육학
복합학
개인구독
소속 기관이 없으신 경우, 개인 정기구독을 하시면 저렴하게
논문을 무제한 열람 이용할 수 있어요.
지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
초록·키워드
This study addresses the growing need for precision maintenance in increasingly complex semiconductor manufacturing environments, where real-time event and condition monitoring data are often unavailable. To overcome this limitation, we employ a survival analysis-based approach that leverages historical maintenance records to estimate hazard functions and derive survival functions for individual equipment components. This enables the development of replacement criteria based on survival probability thresholds without relying on real-time condition monitoring. Under constraints of limited data availability, we fit parametric distributions to observed replacement intervals, select the best unimodal model via the Kolmogorov-Smirnov test, and, when necessary, approximate bimodal behavior using Gaussian mixture models. From these survival curves, we propose three replacement criteria that balance early and delayed maintenance risks. Scenario analysis demonstrates that applying the proposed criteria can achieve up to a 40 % reduction in maintenance costs compared to conventional policies. The findings validate the efficacy of our method in supporting maintenance decision-making, reducing unnecessary component replacements, and maintaining process stability. By offering a practical and scalable alternative to data-intensive maintenance strategies, our framework enhances operational efficiency and reliability in semiconductor manufacturing—and serves as a model for predictive maintenance under limited data availability in other high-value process industries.
본문·목차
인공지능 문자 인식 모델을 통해 추출된 텍스트로, 일부 오타나 오류가 포함될 수 있으나 지속적으로 개선 중입니다.
오류를 발견하셨다면 해당 부분을 드래그한 후 ' 를 통해 신고해주세요.
오류를 발견하셨다면 해당 부분을 드래그한 후 ' 를 통해 신고해주세요.
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UCI(KEPA) : I410-151-25-02-093727175