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논문 기본 정보

저자정보
(Dankook University) (Com2uS) (LIG Nex1) (Samsung Electronics)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.25 No.5
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    초록·키워드

    In this work, we present a novel adaptive testing method based on convolutional neural networks (CNNs). We propose a conversion method of test patterns into spectral images using the fast Fourier transform (FFT), which enables consistent dimensionality across various circuits and allows the CNN to extract frequency-domain features. Moreover, we investigate the effect of different types of spectral images by comparing a single-channel magnitude image with a multi-channel image that includes magnitude, real, and imaginary parts. Experimental results on the ISCAS ’85 benchmark circuits show that the proposed method achieves over 95% accuracy with a maximum of 97% reduced parameters compared to MLP and conventional CNNs. Therefore, we demonstrate the effectiveness and scalability of the proposed method for adaptive testing.

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      UCI(KEPA) : I410-151-26-02-094305258