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논문 기본 정보

저자정보
(Hankuk University of Foreign Studies) (Hankuk University of Foreign Studies)
저널정보
대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.26 No.2
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    초록·키워드

    To directly extract the model parameters of the physical off-state small-signal equivalent circuit of body-contact PD-SOI MOSFETs, novel extraction equations are derived from Y -parameter equations approximated in both low and high-frequency regions. Unlike conventional direct extraction methods that require additional test patterns or measurements under varying bias conditions, the proposed technique enables direct extraction of all off-state equivalent circuit parameters using only a single S-parameter measurement, making it much simpler. The off-state model built with this novel extraction method shows excellent agreement with measured S-parameters in the wide bias range and the frequency range from 100 MHz to 40 GHz.

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