인문학
사회과학
자연과학
공학
의약학
농수해양학
예술체육학
복합학
지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2017.8
- 수록면
- 285 - 291 (7page)
- DOI
- 10.4150/KPMI.2017.24.4.285
이용수
초록· 키워드
We propose a custom analysis technique for the dark field (DF) image based on transmission electron microscopy (TEM). The custom analysis technique is developed based on the DigitalMicrograph® (DM) script language embedded in the Gatan digital microscopy software, which is used as the operational software for most TEM instruments.
The developed software automatically scans an electron beam across a TEM sample and records a series of electron diffraction patterns. The recorded electron diffraction patterns provide DF and ADF images based on digital image processing. An experimental electron diffraction pattern is recorded from a IrMn polycrystal consisting of fine nanograins in order to test the proposed software. We demonstrate that the developed image processing technique well resolves nanograins of ~ 5 nm in diameter.
#DigitalMicrograph® (DM) script
#DigitalMicrograph® (DM) script
#Transmission electron microscopy
#Transmission electron microscopy
#Nanomaterials
#Nanomaterials
#scanning electron diffraction technique
#scanning electron diffraction technique
#Image analysis
#Image analysis
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