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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 한국전자파학회JEES Journal of Electromagnetic Engineering And Science Journal of Electromagnetic Engineering And Science Vol.26 No.3
- 발행연도
- 2026.5
- 수록면
- 239 - 245 (7page)
이용수
초록· 키워드
In this paper, a quantitative evaluation method that uses near-field noise injection testing to assess the electromagnetic immunity of display devices is proposed. The proposed method identifies electromagnetic immunity vulnerabilities within systems through near-field emission measurements by injecting frequency-specific near-field noise into the systems and then analyzing the resulting variations in pixel and frame error rates. Based on the proposed method, the error rate measurement results were divided into two zones—a normal operation zone and a performance degradation zone—and simplified using linear models according to the performance metrics of each zone. Drawing on the model for the performance degradation zone, the display noise susceptibility index (DNSI) was defined as a quantitative metric for evaluating the electromagnetic immunity of display devices. The proposed method was experimentally validated by evaluating the DNSI metrics based on the injected noise frequency, with the results confirming the successful quantitative evaluation of the electromagnetic immunity levels of a display device at various testing frequencies.
#Display Devices
#Electromagnetic Immunity
#Frame Error Ratio
#Pixel Error Ratio
#Quantitative Evaluation
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목차
- Abstract
- I. INTRODUCTION
- II. CHARACTERIZATION OF SPATIAL ELECTROMAGNETIC VULNERABILITY BASED ON NEAR-FIELD MEASUREMENT
- III. PROPOSED ELECTROMAGNETIC IMMUNITY EVALUATION METHOD BASED ON PIXEL AND FRAME ERROR DETECTION
- IV. EXPERIMENTAL VERIFICATION
- V. CONCLUSION
- REFERENCES
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