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커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
초록·키워드
Abstract Herein, the significant impact of the spin‐coated Cr 2 O 3 interface layer on the electrical properties and performance characteristics of Au/undoped‐InP (Au/InP) Schottky diodes (SD) is reported. The material characterization of spin‐coated Cr 2 O 3 films using a wide variety of analytical techniques, namely, atomic force microscopy, field emission scanning electron microscope, X‐ray diffraction, Fourier transform infrared spectroscopy, and Raman spectroscopy, indicate the formation of hexagonal phase, nanocrystalline, and stoichiometric Cr 2 O 3 on InP. Optical absorption measurements reveal a bandgap of ≈3.5 eV. In‐depth analyses and detailed measurements of current‐voltage ( I – V ) and capacitance‐voltage (C‐V) employed to assess the interface characteristics and electrical performance of the Au/InP (SD) versus Au/Cr 2 O 3 /InP (MIS) devices. Compared to SD, MIS revealed superior rectifying properties. Indicating that the Cr 2 O 3 interface layer significantly influences the barrier height (Φ BH ) of SD, the estimated Φ BH (0.64 eV ( I – V )/0.86 eV (C‐V)) is higher than that of SD (0.57 eV ( I – V )/0.67 eV (C‐V)). In addition, Cheungs and Nordes' methods are used to obtain the Φ BH , ideality factor (n), and series resistance (R S ). The equivalent Φ BH values obtained from current–voltage, Cheungs, and Nordes methods demonstrate stability and dependability in addition to validating their superior characteristics of MIS devices. The interface state density (N SS ) for MIS is lower than the SD's, indicating that the effectiveness of Cr 2 O 3 layer significantly reduces N SS . Analyses to probe the mechanism demonstrate that, in SD and MIS, the Schottky emission controls the higher bias area, while the Poole‐Frenkel emission dominates the reverse conduction mechanism at the lower bias region. The present work convincingly demonstrates the potential application of the Cr 2 O 3 interfacial layer in delivering the enhanced performance and contributes to the progression of electrical devices for emerging electronics and energy‐related applications.
인공지능 문자 인식 모델을 통해 추출된 텍스트로, 일부 오타나 오류가 포함될 수 있으나 지속적으로 개선 중입니다.
오류를 발견하셨다면 해당 부분을 드래그한 후 ' 를 통해 신고해주세요.
오류를 발견하셨다면 해당 부분을 드래그한 후 ' 를 통해 신고해주세요.
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