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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2018.9
- 수록면
- 1,309 - 1,318 (10page)
- DOI
- 10.7465/jkdi.2018.29.5.1309
이용수
초록· 키워드
오류제보하기
In this article, two likelihood-based methods are developed to obtain the confidence intervals for the stress-strength reliability of the generalized exponential distribution. When the parameter of interest is the stress-strength reliability of the generalized exponential distribution, we construct the confidence intervals of the stress-strength reliability based on the signed log-likelihood ratio statistic and the modified signed log-likelihood ratio statistic for the parameter of interest. Simulations are performed to show the accuracy of the proposed method in terms of estimated coverage probability and bilateral symmetry of the confidence intervals when the sample size is small. And an example is provided.
목차
Abstract
1. Introduction
2. Development of confidence intervals based on likelihood-based methods
3. Numerical studies
4. Concluding remarks
References
참고문헌 (17)
참고문헌 신청
[학술지(정기간행물)] - Awad, A. M. / 1981 / Some inference results on pr(x < y) in the bivariate exponential model / Communications in Statistics-Theory and Method 10 : 2515 ~ 2525
[학술지(정기간행물)] - Barndorff-Nielsen, O. E. / 1986 / Inference on full and partial parameters, based on the standardized signed log likelihood ratio / Biometrika 73 : 307 ~ 322
[학술지(정기간행물)] - Barndorff-Nielsen, O. E. / 1991 / Modified signed log likelihood ratio / Biometrika 78 : 557 ~ 563
[단행본] - Barndorff-Nielsen, O. E. / 1994 / Inference and asymptotics / Chapman and Hall
[단행본] - Cox, D. R. / 1974 / Theoretical statistics / Chapman and Hall
[학술지(정기간행물)] - Barndorff-Nielsen, O. E. / 1986 / Inference on full and partial parameters, based on the standardized signed log likelihood ratio / Biometrika 73 : 307 ~ 322
[학술지(정기간행물)] - Barndorff-Nielsen, O. E. / 1991 / Modified signed log likelihood ratio / Biometrika 78 : 557 ~ 563
[단행본] - Barndorff-Nielsen, O. E. / 1994 / Inference and asymptotics / Chapman and Hall
[단행본] - Cox, D. R. / 1974 / Theoretical statistics / Chapman and Hall
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