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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2019.7
- 수록면
- 919 - 931 (13page)
- DOI
- 10.7465/jkdi.2019.30.4.919
이용수
초록· 키워드
오류제보하기
We propose a method for obtaining run-length distribution for Shewhart control charts with supplementary runs rules. We use Markov chain imbedding for obtaining the run length distribution. The method has several advantages. It is easy and fast to calculate and can be applied to other areas such as reliability with these advantages. In addition, accurate and clear distribution can be obtained. In this paper, we calculate probabilities of the run length according to the changes of the variances through S² control charts with supplementary runs rules. When the variance increases, the average run length (ARL) decreases rapidly. Also, when the degree of freedom increases, the ARL decreases.
목차
Abstract
1. Introduction
2. Finite Markov chain imbedding
3. Distribution of run-length
4. Conclusions
References
참고문헌 (11)
참고문헌 신청
Aki, S. / 1985 / Discrete distributions of order k on a binary sequence / Ann. Inst. Statist. Math 37:205~224
Balakrishnan, N. / 2002 / Runs and scans with applications / John Wiley & Sons, Inc
Yi-Ming Bi / 2016 / Run related probability function and their application to start-up demonstration tests / 한국데이터정보과학회지 27(4):1067~1074
Champ, C. W. / 1987 / Exact results for Shewhart control charts with supplementary runs rules / Technometrics 29:393~399
Fu, J. C. / 1985 / Reliability of a large consecutive k-out-of-n: F system / IEEE Transactions on Reliability 34:127~130
Balakrishnan, N. / 2002 / Runs and scans with applications / John Wiley & Sons, Inc
Yi-Ming Bi / 2016 / Run related probability function and their application to start-up demonstration tests / 한국데이터정보과학회지 27(4):1067~1074
Champ, C. W. / 1987 / Exact results for Shewhart control charts with supplementary runs rules / Technometrics 29:393~399
Fu, J. C. / 1985 / Reliability of a large consecutive k-out-of-n: F system / IEEE Transactions on Reliability 34:127~130
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UCI(KEPA) : I410-ECN-0101-2019-041-000951468