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이희덕 (Hi-Deok Lee)

소속기관
Chungnam National University
소속부서
전자공학과
직급
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ORCID
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연구경력
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주요 연구분야

  • 공학 > 전자/정보통신공학 TOP 5%
  • 자연과학 > 물리학
  • 공학 > 기계공학

저자의 연구 키워드

저자가 작성한 논문들의 주요 키워드입니다.

저자의 연구 키워드
#3-level charge pumping
#Ag nanoparticles
#AHA (Al₂O₃-HfO₂-Al₂O₃)
#Al₂O₃
#antimony interlayer
#anti-reflection coating
#band-to-band tunneling (BTBT)
#blistering
#capture time constant
#charge trapping effect
#CIGS solar cell
#cobalt
#Contact resistance
#contact resistance reduction
#cut-off frequency (f<SUB>T</SUB>)
#C-V method
#dielectric relaxation
#effective channel width
#effective Schottky barrier height
#emission time constant
#evaporation
#field-effect passivation
#Ge MOSFET
#germanide
#Germanium
#hole trapping
#hydrogen
#InGaAs
#interface state
#interface trap
#interlayer
#layout
#low contact resistance
#mean time
#metal-oxide semiconductor field-effect transistor (MOSFET)
#MIM (Metal-Insulator-Metal)
#minority carrier lifetime
#MONOS Flash memory
#Multi-finger MOSFET
#nchannel MOSFETs
#Nckel silicide
#Negative bias temperature instability (NBTI)
#negative fixed oxide charge
#NH4OH
#nickel
#Ni-InGaAs
#Ni–InGaAs
#n-In<SUB>0.53</SUB>Ga<SUB>0.47</SUB>As
#Nitride/Oxide interface trap
#optical absorption
#parasitic capacitance
#passivation layer
#permanenttraps
#photo current
#post-deposition annealing
#power-law exponent
#retention
#RF performance
#RTS noise
#RTS noiseamplitude
#Schottky diode
#SHS (SiO₂-HfO₂-SiO₂)
#silicon rich nitride
#Sn interlayer
#SOHOS flash memory
#Solar cell
#specific contact resistivity
#Surface plasmon resonance effect
#thermal ALD
#thermal stability
#trap depth
#Tunneling field-effect transistor (TFET)
#tunneling path
#wide bandgap

저자의 논문 현황

연도별 상세보기를 클릭하시면 연도별 이용수·피인용수 상세 현황을 확인하실 수 있습니다.
피인용수는 저자의 논문이 DBpia 내 인용된 횟수이며, 실제 인용된 횟수보다 적을 수 있습니다.
  • 논문수91
  • 발행기간1990 ~ 2018
  • 이용수3,971
  • 피인용수1

논문제목를 인용한 논문목록입니다.

  • 피인용 논문 제목
    • 피인용 논문 저자
게시판 목록
논문명 저널명 발행연도 이용수 피인용수
터널링 전계효과 트랜지스터의 온도에 따른 노이즈 메커니즘 분석 대한전자공학회 학술대회 2018 29 0
Reducing Contact Resistance Between Ni-InGaAs and n-In0.53Ga0.47As using Sn Interlayer in n-In0.53Ga0.47As MOSFETs JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2018 19 0
Analysis of Anomalously Large RTS Noise Amplitudes in Tunneling Field-effect Transistors JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2018 38 0
Identification of Interface States and Shallow and Deep Hole Traps under NBTI Stress using Fast, Normal, and Charge-pumping Measurement Techniques JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2018 24 0
A Study on Thermal Stability Improvement in Ni Germanide/p-Ge using Co interlayer for Ge MOSFETs JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2017 15 0
Methodology for Extracting Trap Depth using Statistical RTS Noise Data of Capture and Emission Time Constant JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2017 14 0
Contact Resistance Reduction between Ni–InGaAs and n-InGaAs via Rapid Thermal Annealing in Hydrogen Atmosphere JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2017 12 0
화합물-실리콘 이종 반도체 융합 공정에 따른 실리콘 웨이퍼 뒷면 비소 오염 최소화 연구 대한전자공학회 학술대회 2016 33 0
A Study on Contact Resistance Reduction in Ni Germanide/Ge using Sb Interlayer JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2016 13 0
MONOS 플래시 메모리의 Nitride 트랩 분석 전자공학회논문지 2015 102 0
차세대 반도체 소자 기술 전자공학회지 2015 213 0
Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2015 21 0
Ag 함량이 진공증발법으로 형성된 광금지대 (Ag,Cu)(In,Ga)Se₂ 태양전지에 미치는 영향 Current Photovoltaic Research 2015 15 0
Enhanced Photo Current in n-ZnO/p-Si Diode Via Embedded Ag Nanoparticles for the Solar Cell Application JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2015 16 0
A Study of the Dependence of Effective Schottky Barrier Height in Ni Silicide/n-Si on the Thickness of the Antimony Interlayer for High Performance n-channel MOSFETs JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2015 13 0
Characterization of Dielectric Relaxation and Reliability of High-k MIM Capacitor Under Constant Voltage Stress JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2014 26 0
Analysis of SOHOS Flash Memory with 3-level Charge Pumping Method JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2014 45 0
Blistering Induced Degradation of Thermal Stability Al₂O₃ Passivation Layer in Crystal Si Solar Cells JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2014 31 0
A Novel Atomic Layer Deposited Al₂O₃ Film with Diluted NH₄OH for High-Efficient c-Si Solar Cell JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2014 29 0
Process Temperature Dependence of Al₂O₃ Film Deposited by Thermal ALD as a Passivation Layer for c-Si Solar Cells JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2013 33 1
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