A PC based Automatic Program Generator for In-Circuit Testing

Tay Beng Kang ,  Chong Yong Kim ,  A. H. Phua 외 1명

JTC-CSCC : Joint Technical Conference on Circuits Systems, Computers and Communications

1994 .01

Test Generation for Sequential Circuits

Dong Ho Lee

대한전자공학회 학술대회

1994 .07

AN AUTOMATIC TEST PATTERN GENERATOR FOR PARALLEL AND DISTRIBUTED SYSTEMS

Stefan Radtke ,  Wolfgang K ,  ebs 외 2명

ICVC : International Conference on VLSI and CAD

1995 .01

Feedback Analysis of Sequential Circuits

Edwa ,  d Chin Hsi Ling ,  Tay Beng Kang

JTC-CSCC : Joint Technical Conference on Circuits Systems, Computers and Communications

1994 .01

시이컨셜회로 구현에 관한 연구

박춘명

대한전자공학회 학술대회

2012 .11

A Parallel Algorithm For The Synthesis of Sequential Circuits

Lu Ying Ping ,  Wang Wen Zhang

대한전자공학회 기타 간행물

1992 .01

An Improvement of a State Encoding Algorithm for Sequential Circuits

Nobuhiko Ito ,  Agus Ha ,  nowo 외 1명

JTC-CSCC : Joint Technical Conference on Circuits Systems, Computers and Communications

1991 .01

동기식 순서논리회로의 자동시험패턴생성 ( Automatic Test Pattern Generation of Synchronous Sequential Circuit )

안광선 ,  김명수 ,  박세명

한국통신학회 학술대회논문집

1989 .01

동기식 순서논리회로의 자동시험패턴생성 ( Automatic Test Pattern Generation of Synchronous Sequential Circuit )

안광선 ,  김명수 ,  박세명

특정연구 결과 발표회 논문집

1989 .01

Design and Simulation of Neural Network Digital Sequential Circuits

Hi ,  oshi Ninomiya ,  Hideki Asai

JTC-CSCC : Joint Technical Conference on Circuits Systems, Computers and Communications

1993 .01

Test Generation for Sequential Circuits Using Partitioned Image Computation

Ho Yong Choi ,  Hi ,  ono 외 10명

JTC-CSCC : Joint Technical Conference on Circuits Systems, Computers and Communications

1993 .01

A High Speed Fault Simulator for Sequential Circuits with Bidirectional Elements

M. S. Kang ,  Y. Shimosakoda ,  H. Iwashita 외 2명

ICVC : International Conference on VLSI and CAD

1991 .01

논리결함 검사를 위한 Pattern Generator의 PLD 회로 설계

김준식 ,  노영동

한국반도체장비학회지

2003 .01

Test Generation for Sequential Circuits Using Shared Binary Decision Diagram

Ho Yong Choi

KITE JOURNAL OF ELECTRONICS ENGINEERING

1993 .01

[特輯]AUTOMATIC RESTRUCTURING OF SEQUENTIAL PROGRAMS FOR PARALLEL PROCESSING

Gyungho Lee ,  Haengchul Pa ,  k

정보과학회지

1991 .08

A Path-Delay Test Generator for Large VLSI Circuits

Bill Unde ,  wood ,  Sungho Kang 외 1명

ICVC : International Conference on VLSI and CAD

1993 .01

Built-In Self Test 방식에 의한 순서회로의 설계 ( Design of Sequential Circuit Using Built-In Self Test Method )

노승용 ,  임인칠

전자공학회논문지

1987 .09

Soft Error Susceptibility Analysis for Sequential Circuit Elements Based on EPPM

CAI Shuo ,  KUANG Ji-shun ,  LIU Tie-qiao 외 1명

JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE

2015 .04

A New Algorithm for Web Sequential Pattern Discovery

WORAPOJ KREESURADEJ ,  BUNYAT THIPMOUD

ITC-CSCC :International Technical Conference on Circuits Systems, Computers and Communications

2004 .07

축-토크법을 이용한 새로운 발전기 효율시험 방법의 제안

김현한 ,  옥연호 ,  김광호

전기학회논문지

2014 .04