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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE Journal of Semiconductor Technology and Science Vol.15 No.6
- 발행연도
- 2015.12
- 수록면
- 664 - 670 (7page)
이용수
초록· 키워드
오류제보하기
A four-times-VDD switch that supports high and low voltage mode operations is demonstrated in a generic 65 nm logic process. The proposed switch shows the robust operation for supply voltages ranging from VDD to 4 × VDD. A cascaded voltage switch and a voltage doubler based charge pump generate the intermediate supply voltage levels required for the proposed high voltage switch. All the high voltage circuits developed in this work can be implemented using standard logic transistors without being subject to any voltage overstress.
목차
Abstract
I. INTRODUCTION
II. PROPOSED 4 × VDD SWITCH
III. PROPOSED CASCADED VOLTAGE SWITCH
IV. TEST CHIP AND MEASUREMENT RESULT
V. CONCLUSIONS
REFERENCES
참고문헌 (10)
참고문헌 신청
[학술지(정기간행물)] - Y. Moghe / 2011 / Nanosecond Delay Floating High Voltage Level Shifters in a 0.35μm HV-CMOS Technology / IEEE J. of Solid- State Circuits 46 (2) : 485 ~ 497
[학술지(정기간행물)] - B. Serneels / 2005 / A High-Voltage Output Driver in a 2.5V 0.25μm CMOS Technology / IEEE J. of Solid-State Circuits 40 (3) : 576 ~ 583
[학술지(정기간행물)] - E. Mentze / 2006 / A Scalable High-Voltage Output Driver for Low-Voltage CMOS Technologies / IEEE Trans. on VLSI systems 14 (12) : 1347 ~ 1353
[학술지(정기간행물)] - J. Fritzin / 2012 / Analysis of a 5.5V Class-D Stage Used in +30dBm Outphasing RF PAs in 130nm and 65nm CMOS / IEEE. Trans. on Circuits and Systems II 59 (11)
[학술대회논문] - J. Raszka / 2004 / Embedded Flash Memory for Security Applications in a 0.13μm CMOS Logic Process / IEEE Int. Solid-State Circuits Conf. (ISSCC) : 46 ~ 47
[학술지(정기간행물)] - B. Serneels / 2005 / A High-Voltage Output Driver in a 2.5V 0.25μm CMOS Technology / IEEE J. of Solid-State Circuits 40 (3) : 576 ~ 583
[학술지(정기간행물)] - E. Mentze / 2006 / A Scalable High-Voltage Output Driver for Low-Voltage CMOS Technologies / IEEE Trans. on VLSI systems 14 (12) : 1347 ~ 1353
[학술지(정기간행물)] - J. Fritzin / 2012 / Analysis of a 5.5V Class-D Stage Used in +30dBm Outphasing RF PAs in 130nm and 65nm CMOS / IEEE. Trans. on Circuits and Systems II 59 (11)
[학술대회논문] - J. Raszka / 2004 / Embedded Flash Memory for Security Applications in a 0.13μm CMOS Logic Process / IEEE Int. Solid-State Circuits Conf. (ISSCC) : 46 ~ 47
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UCI(KEPA) : I410-ECN-0101-2016-569-002142120